Review Article
Review of Ni-Cu Based Front Side Metallization for c-Si Solar Cells
Table 6
Methods for characterizing background plating.
| No. | Characterization method | Characterization technique that can be used | Information obtained |
| 1 | Surface morphology Studies | SEM and optical microscopy | Size of the deposits and density quantification possible | 2 | Optical measurements | UV/V is spectroscopy setup with an integrating sphere | Shading losses can be estimated | 3 | Elemental analysis | Energy dispersive analysis, total reflection X-ray fluorescence | Constituents of the deposits can be known and density can be quantified | 4 | Luminescence imaging | Lock-in thermography, photoluminescence, electroLuminescence | Localized shunt formation can be detected | 5 | Quasi-steady state Photoconductance studies | Life time and Suns- studies | Variation in life time due to defect introduction and impact on passivation properties possible. Shunt creation can be determined |
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