Research Article
Angle-Resolved Intensity of In-Axis/Off-Axis Polarized Micro-Raman Spectroscopy for Monocrystalline Silicon
Figure 2
Raman intensity sum distribution of vertical backscattering under different sample rotation angles α and polarization directions φ/γ of the (a) HH case and (b) HV case.
(a) |
(b) |