Journals
Publish with us
Publishing partnerships
About us
Blog
Science and Technology of Nuclear Installations
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Science and Technology of Nuclear Installations
/
2024
/
Article
/
Fig 13
/
Review Article
Overview on Radiation Damage Effects and Protection Techniques in Microelectronic Devices
Figure 13
Number of surviving devices versus neutron fluence [
47
]. (a) SiC MOSFET-R. (b) SiC MOSFET-C.
(a)
(b)