Interfacial Properties of CZTS Thin Film Solar Cell

Figure 2

(a) AFM topograpy, (b) 3D AFM surface visualization, and (c) a line profile of the topography signal from the region A-B from (a). The line scans display the average roughness ()—10.94 nm between blue dashed-double dotted lines, the —9.75 nm between red dashed-double dotted lines, and the —7.19 nm between green dashed-double dotted lines, respectively, of the Cu-deficient CZTS film.

(a)

(b)

(c)